Download PDF by Nikhil Pal: Advanced Techniques in Knowledge Discovery and Data Mining

By Nikhil Pal

ISBN-10: 1852338679

ISBN-13: 9781852338671

Transparent and concise factors to appreciate the training paradigms. Chapters written by means of prime international specialists.

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To solve this problem we need to semiautomate the DMKD process, provide integrated DM tools and services, thus making the DMKD process easier and less expensive to use by the end user. The technologies described in this chapter (XML, XMP-RPC, SOAP, PMML, UDDI, OLAP, and OLE DB-DM) will play a significant role in the design of the such next-generation DMKD process framework. These technologies will make it possible to build DM toolboxes that span multiple DM tools; to build knowledge repositories; to communicate and interact between DM tools, DBMSs, and knowledge repositories; and most importantly, to semiautomate the entire DMKD process.

866–883, 1996. , IBM DB2 extender, Proceedings of the Sixteenth International Conference on Data Engineering, pp. 569–73, San Diego, CA, 2000. org/TR/xpath, 1999. , YATL: A Functional and Declarative Language for XML, technical report, INRIA Rocquencourt and Bell Laboratories, 2000. org, 2001. org/TR/NOTE-xml-ql/, 1998. [28] Dillon, W. , Multivariate Analysis: Methods and Applications, New York: Wiley, 1984. org/, 2001. [30] Fayyad, U. , Advances in Knowledge Discovery and Data Mining, AAAI/MIT Press, 1996.

These tests are also called parametric tests as the results are actual measurement values for device parameters, like the threshold voltage or saturation currenrt of some specific transistor. Later the actual ICs on the wafer are subjected to functional and parametric tests (FT and PT) on the wafer to decide which devices should be packaged after singulation. These tests are usually performed on a multitude of devices to save time. A sequence of tests is performed on each chip, and the first test that fails is recorded.

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Advanced Techniques in Knowledge Discovery and Data Mining (Advanced Information and Knowledge Processing) by Nikhil Pal


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